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Structure, electronic properties, and interactions of defects in epitaxial GaN layers [E-Book] /
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Structure, electronic properties, and interactions of defects in epitaxial GaN layers /
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Defect recognition and image processing in semicondoctors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semiconductors : (DRIP VII) : held in Templin, Germany, 7 - 10 September 1997 /
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Untersuchung der bei der Eindiffusion von Zn in InP entstehenden Gitterfehlordnung.
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Imperfections in III/V materials /
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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
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Untersuchung struktureller Defekte in GaAs mit Röntgen-Kleinwinkelstreuung unter Anwendung der Streukontrastvariation [E-Book] /
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Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /
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Optische Spektroskopie und Röntgenbeugung an Fehlstellen in Galliumarsenid nach Tieftemperatur-Elektronenbestrahlung [E-Book] /
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Elektronenmikroskopische Untersuchungen von Gitterbaufehlern in Galliumarsenid [E-Book] /
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
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Atomic diffusion in III-V semiconductors.
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Tuck, B.
1988
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Defect recognition and image processing in III-V compounds. 0002 : International symposium on defect recognition and image processing in III-V compounds. 0002: proceedings : DRIP. 0002: proceedings : Monterey, CA, 27.04.87-29.04.87.
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Defect recognition and image processing in III-V compounds : Proceedings of the international symposium : Drip. 1985 : Montpellier, 02.07.1985-04.07.1985.
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