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IAS-9
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1
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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
Egerton, R. F.
2016
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FHG
-
Electron
microscopy
...
”
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2
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Electron microscopy and analysis /
Goodhew, Peter J.
2001
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FHG
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Electron
microscopy
...
”
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IAS-9
ZB
1
Name
Beanland, Richard
1
Egerton, R. F.
1
Goodhew, Peter J.
1
Humphreys, John
1
Subject
electron microscopy
2
scanning electron microscopy
2
transmission electron microscopy
2
electron diffraction
1
electron microscope
1
electron optics
1
Classification
FHG - Electron microscopy
2
Language
English
2
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