1
Noncontact atomic force microscopy /
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Introduction to surface and thin film processes /
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Chemistry and physics of solid surfaces. 0008 : International summer institute in surface science. 0009: review articles : ISISS. 1989: review articles : Milwaukee, WI, 08.89.
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Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
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Briggs, D.
1990
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Ecasia. 1985 : Veldhoven, 14.10.1985-18.10.1985.
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1986
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Fundamentals of surface and thin film analysis /
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Practical surface analysis : by Auger and x-ray photoelectron spectroscopy /
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Briggs, D.
1983
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Applied surface analysis : symposium. 2 : Papers : Dayton, OH, 11.06.80-13.06.80.
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Applied surface analysis : symposium. 0003 : Dayton, OH, 03.06.81-05.06.81.
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Applications of advanced surface spectroscopic techniques : Solid vacuum interface conference 6 : Delft, 07.05.80-09.05.80.
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1980
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Non traditional approaches to the study of the solid electrolyte interface : Proceedings of an international conference : Snowmass, CO, 24.09.79-27.09.79.
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Applied surface analysis : symposium. 1 : Dayton, OH, 11.06.79-13.06.79.
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Electron spectroscopy for surface analysis /
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Surface analysis techniques for metallurgical applications : symposium on surface analysis techniques for metallurgical applications : Pittsburgh analytical conference : Cleveland, OH, 04.03.75
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