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FHEE - X-ray microscopy, surface topography
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FHEE - X-ray microscopy, surface topography
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1
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Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen /
Brümmer, Otto
1980
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
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IFF
ZB
1
Name
Brümmer, Otto
1
Subject
electron diffraction
1
Classification
FGGJ - Ion beam analysis, ion beam solid interaction
1
FHA - Materials characterization - general aspects
1
FHAB - Surface and thin film characterization
1
FHEE - X-ray microscopy, surface topography
FHGE - Electron diffraction
1
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