Print Edition 8

Book 8

Conference Publication 6

ZB IEK-5 2 IEK-4 1

materials characterization microscopy 2 solid state spectroscopy 2 X-ray diffraction 1 X-ray fluorescence analysis 1 archaeological specimen 1 more ... archaeometry 1 atomic spectroscopy 1 diagnostic technique 1 electron diffraction 1 electron microprobe analysis 1 electron microscopy 1 epitaxy 1 growth 1 imaging technique 1 interface 1 ion beam analysis 1 ion microscopy 1 materials processing 1 neutron diffraction 1 nondestructive testing 1 optical spectroscopy 1 quantum dot 1 quantum wire 1 scanning electron microscopy 1 semiconductor heterostructure 1 semiconductor processing 1 small angle scattering 1 surface 1 surface analysis 1 see all ... less ...

FAF - Materials research - comprehensive works FHA - Materials characterization - general aspects 4 FGML - Characterization of electronic materials 2 AHXB - Archaeology 1 FFPE - Thin film electronic properties, semiconductor interfaces 1 FGK - Thin film technology, epitaxy 1 more ... FHE - Imaging methods in materials characterization 1 FJNC - Optical spectroscopy in solids 1 FPM - Materials testing - general aspects 1 see all ... less ...