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IEK-14
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1
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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
Benninghoven, A.
1988
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2
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Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
Benninghoven, A.
1986
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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
Benninghoven, A.
1984
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Secondary ion mass spectrometry: international conference 0003: proceedings : SIMS 0003: proceedings : Budapest, 30.08.81-05.09.81.
Benninghoven, A.
1982
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5
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Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.
Benninghoven, A.
1979
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IEK-14
ZB
5
IBN-1-2
1
Name
Benninghoven, A.
5
Subject
SIMS (secondary ion mass spectroscopy)
3
secondary ion emission
2
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FGGJ - Ion beam analysis, ion beam solid interaction
5
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