Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Book
IAS-9
Reset Filters
Show filters (2)
Book
IAS-9
Ask a Librarian
Books & more
: Hits
1 - 4
of
4
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
Egerton, R. F.
2016
“
...
FHG
-
Electron
microscopy
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Transmission electron microscopy : physics of image formation /
Reimer, L.
2008
“
...
FHG
-
Electron
microscopy
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 3
3
Book
Introduction to conventional transmission electron microscopy /
Graef, Marc De
2003
“
...
FHG
-
Electron
microscopy
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 4
4
Book
Electron microscopy and analysis /
Goodhew, Peter J.
2001
“
...
FHG
-
Electron
microscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Print Edition
4
Material Type
Book
Type of Literature
Handbook, Textbook
2
Year of Publication
From:
To:
Location
IAS-9
ZB
1
Name
Beanland, Richard
1
Egerton, R. F.
1
Goodhew, Peter J.
1
Graef, Marc De
1
Humphreys, John
1
Kohl, H.
1
more ...
Reimer, L.
1
see all ...
less ...
Subject
transmission electron microscopy
4
crystal defect
2
electron diffraction
2
electron microscopy
2
electron optics
2
scanning electron microscopy
2
more ...
diffraction
1
electron microscope
1
electron scattering
1
quantum mechanics
1
scattering
1
see all ...
less ...
Classification
FHG - Electron microscopy
4
FHGB - Conventional electron microscopy
1
Language
English
4
/* End Narrow Search Options */ ?>
×
Loading...