1
Nanostructured thin films and coatings : mechanical properties /
Book
Zhang, Sam
2019
...FHAB - Surface and thin film characterization...
Table of Contents 
2
Impedance spectroscopy : theory, experiment, and applications /
Book
...FHAB - Surface and thin film characterization ...
Table of Contents 
3
Handbook of surfaces and interfaces of materials. 2. Surface and interface analysis of properties /
Book
...FHAB - Surface and thin film characterization...
4
Handbook of surfaces and interfaces of materials. 4. Solid thin films and layers /
Book
...FHAB - Surface and thin film characterization...
5
Introduction to surface and thin film processes /
Book
...FHAB - Surface and thin film characterization...
Table of Contents 
6
Introduction to surface roughness and scattering /
Book
...FHAB - Surface and thin film characterization...
7
Working smarter with surface analysis techniques.
Book
1999
...FHAB - Surface and thin film characterization...
8
Surface characterization : a user's sourcebook /
Book
Brune, D.
1997
...FHAB - Surface and thin film characterization...
9
Schichtmesstechnik.
Book
...FHAB - Surface and thin film characterization...
10
Surface electrochemistry : a molecular level approach /
Book
...FHAB - Surface and thin film characterization...
11
High resolution XPS of organic polymers: the Scienta ESCA 300 database.
Book
...FHAB - Surface and thin film characterization...
12
Introduction to surface roughness and scattering /
Book
...FHAB - Surface and thin film characterization...
13
Impedance spectroscopy : emphasizing solid materials and systems /
Book
...FHAB - Surface and thin film characterization...
Table of Contents 
14
Fundamentals of surface and thin film analysis /
Book
...FHAB - Surface and thin film characterization...
15
Modern techniques of surface science.
Book
...FHAB - Surface and thin film characterization...
16
Mikroanalyse mit Elektronen- und Ionensonden.
Book
...FHAB - Surface and thin film characterization...
17
Mikroanalyse mit Elektronen- und Ionensonden /
Book
...FHAB - Surface and thin film characterization...