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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem solar-cells /
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem solar cells [E-Book] /
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Magnetic and structural properties of thin films and nanoparticles studied by scattering methods [E-Book] /
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Fundamentals of nanoscale film analysis /
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Magnetic and structural properties of thin films and nanoparticles studied by scattering methods /
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Surface and thin film analysis : principles, instrumentation, applications /
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Characterization of nanophase materials /
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Characterization and metrology for ULSI technology : 1998 international conference Gaithersburg, Maryland [23. - 27.] March 1998 : [the 1998 International Conference on Characterization and Metrology for ULSI Technology] /
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Charakterisierung dünner Schichten /
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Analysis of microelectronic materials and devices.
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Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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