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E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 3 /
Giessibl, Franz J.
2015
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
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2
E-Book
CMOS Cantilever Sensor Systems [E-Book] : Atomic Force Microscopy and Gas Sensing Applications /
Lange, D.
2002
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
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Name
Baltes, H.
1
Brand, O.
1
Giessibl, Franz J.
1
Lange, D.
1
Meyer, Ernst.
1
Morita, Seizo.
1
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Wiesendanger, Roland.
1
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Subject
Nanotechnology.
2
Physics.
force microscopy
2
scanning probe microscopy
2
Control engineering.
1
Engineering.
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Materials science.
1
Measurement.
1
Mechatronics.
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Physical measurements.
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Robotics.
1
Surfaces (Physics).
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