Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
SIMS (secondary ion mass spectroscopy)
Benninghoven, Alfred
Reset Filters
Show filters (2)
SIMS (secondary ion mass spectroscopy)
Benninghoven, Alfred
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Benninghoven, Alfred
1987
“
...
FGGJ
-
Ion
beam
analysis
,
ion
beam
solid
interaction
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Print Edition
1
Material Type
Book
1
Year of Publication
From:
To:
Location
IBN-1-2
1
IEK-14
1
ZB
1
Name
Benninghoven, Alfred
Rüdenauer, Friedrich G.
1
Werner, H. W.
1
Subject
SIMS (secondary ion mass spectroscopy)
Classification
FGGJ - Ion beam analysis, ion beam solid interaction
1
Language
English
1
×
Loading...
