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E-Book
Electrical Atomic Force Microscopy for Nanoelectronics [E-Book] /
Celano, Umberto
2019
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
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2
E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 3 /
Giessibl, Franz J.
2015
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
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Available as
Electronic Edition
2
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Book
2
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ZB
2
Name
Celano, Umberto
1
Giessibl, Franz J.
1
Meyer, Ernst.
1
Morita, Seizo.
1
Wiesendanger, Roland.
1
Subject
Nanotechnology.
2
Surfaces (Physics).
force microscopy
2
scanning probe microscopy
2
Electronics.
1
Optical materials.
1
more ...
Physics.
1
nanoelectronics
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Classification
FHEG - Tunneling microscopy, force microscopy
1
Language
English
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