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XPS (X-ray photoelectron spectroscopy)
Ebel, Maria F.
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XPS (X-ray photoelectron spectroscopy)
Ebel, Maria F.
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Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
Grasserbauer, Manfred.
1986
Subject (ZB):
“
...XPS (X-ray
photoelectron
spectroscopy
)...
”
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ZB
1
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Dudek, Hans Joachim.
1
Ebel, Maria F.
Grasserbauer, Manfred.
1
Subject
Auger electron spectroscopy
1
SIMS (secondary ion mass spectroscopy)
1
XPS (X-ray photoelectron spectroscopy)
surface analysis
1
Classification
FFGC - Electron spectroscopy
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FHAB - Surface and thin film characterization
1
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