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FGGJ - Ion beam analysis, ion beam solid interaction
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FGGJ - Ion beam analysis, ion beam solid interaction
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1
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Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
Grasserbauer, Manfred.
1986
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FFGC
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Electron
spectroscopy
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Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.
Grant, J. T.
1982
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FFGC
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Electron
spectroscopy
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3
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Electron and ion spectroscopy of solids : Based on the lectures pres. at the NATO Advanced Study Institute : Gent, 29.08.77-09.09.77 /
Fiermans, L.
1978
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FFGC
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ZB
3
IFF
1
Name
Dudek, Hans Joachim.
1
Ebel, Maria F.
1
Fiermans, L.
1
Grant, J. T.
1
Grasserbauer, Manfred.
1
Subject
Auger effect
1
Auger electron spectroscopy
1
SIMS (secondary ion mass spectroscopy)
1
XPS (X-ray photoelectron spectroscopy)
1
electron spectroscopy
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ion beam analysis
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surface analysis
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Classification
FFGC - Electron spectroscopy
3
FGGJ - Ion beam analysis, ion beam solid interaction
FHAB - Surface and thin film characterization
3
Language
English
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