1
Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
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Briggs, D.
1990
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2
Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
Book
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3
Modern physical techniques in materials technology /
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Mulvey, T.
1974
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4
Systematic materials analysis. 1.
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