Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
FGKC - Vacuum deposition, MBE
Reset Filters
Show filters (1)
FGKC - Vacuum deposition, MBE
Ask a Librarian
Books & more
: Hits
1 - 3
of
3
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Epitaktisches Wachstum und strukturelle, elektrische und optische Charakterisierung von Ru2Si3-Schichten [E-Book] /
Lenssen, Daniel
2000
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 2
2
E-Book
Morphologische Entwicklung von Pt (111) bei Pt-Deposition und Ionenstrahlerosion [E-Book] /
Kalff, Matthias
1999
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Untersuchung dynamsicher Prozesse bei der Molekularstrahlepitaxie auf Silizium [E-Book] /
Kästner, Martin
1998
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
Full text
JuSER
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
3
Material Type
Book
3
Type of Literature
Theses
3
Year of Publication
From:
To:
Location
ZB
3
Name
Kalff, Matthias
1
Kästner, Martin
1
Lenssen, Daniel
1
Subject
scanning tunneling microscopy
2
band structure
1
heteroepitaxy
1
molecular beam epitaxy
1
platinum
1
semiconductor epitaxy
1
more ...
silicon
1
thin film technology
1
vacuum deposition
1
see all ...
less ...
Classification
FGKC - Vacuum deposition, MBE
FHAB - Surface and thin film characterization
3
FHEG - Tunneling microscopy, force microscopy
2
FJHB - Band structure and electronic transport in semiconductors
1
Language
German
3
×
Loading...