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Introduction to conventional transmission electron microscopy /
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Entwicklung einer niederenergetischen Flüssigmetall-Rasterionensonde für die in-situ Ionenätzung im Transmissionselektronenmikroskop (TEM) /
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Specimen preparation for transmission electron microscopy of materials. 4 : symposium held April 2, 1997, San Francisco, California, USA /
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Specimen preparation for transmission electron microscopy of materials. 3: symposium : MRS specimen preparation workshop . 3 : Boston, MA, 05.12.91-06.12.91 /
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Transmission electron microscopy of minerals and rocks.
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The operation of transmission and scanning electron microscopes.
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Specimen preparation for transmission electron microscopy of materials. 2: symposium : MRS specimen preparation workshop : San-Francisco, CA, 19.04.90-20.04.90 /
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Specimen preparation for transmission electron microscopy of materials: symposium : Boston, MA, 03.12.87.
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Electron beam imaging of noncrystalline materials: one day meeting: proceedings : London, 03.02.88.
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Light element analysis in the transmission electron microscope: WEDX and EELS.
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11
TEM/TED studies of epitaxial layers of ternary and quaternary group III-V compound semiconductor alloys.
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Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
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Materials problem solving with the transmission electron microscope : Materials Research Society fall meeting. 1985 : Boston, MA, 02.12.1985-04.12.1985.
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Analytische Transmissionselektronenmikroskopie /
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Thin foil preparation for electron microscopy /
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Transmission electron microscopy : physics of image formation and microanalysis
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Reimer, L.
1984
“...FHGB - Conventional electron microscopy...”
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The operation of the transmission electron microscope.
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Specimen preparation for transmission electron microscopy of materials.
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Transmission electron microscopy of silicon VLSI circuits and structures /
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Sitzung / Rheinisch-Westfälische Akademie der Wissenschaften. 266 : Düsseldorf, 10.1.79
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1981
“...FHGB - Conventional electron microscopy...”
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