1
Investigation of nanoscale potential fluctuations and defects in 2D semiconducting structures by Scanning Tunneling Microscopy [E-Book] /
“...FHJ - Scanning electron microscopy, analytical electron microscopy...”

JuSER  Table of Contents  Full text 
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Untersuchungen der Zink-Diffusion und Defekterzeugung in Galliumarsenid [E-Book] /
“...FHJ - Scanning electron microscopy, analytical electron microscopy...”

Full text  JuSER 
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