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1
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Metal impurities in silicon-device fabrication /
Graff, Klaus.
2000
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FJH
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Halbleiterphysik
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2
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International Conference on the Physics of Semiconductors. 20,1 : Thessaloniki, Greece, August 6-10, 1990 /
Anastassakis, E. M.
1990
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FJH
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Halbleiterphysik
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2
IEK-5
1
Name
Anastassakis, E. M.
1
Graff, Klaus.
1
Joannopoulos, John D.
1
Subject
crystal defect
2
impurity
fabrication
1
semiconductor
1
semiconductor device
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semiconductor interface
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semiconductor physics
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semiconductor surface
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silicon
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transition metal
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FJH - Semiconductor physics
1
FJHE - Defects and radiation effects in semiconductors
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