1
Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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Ultrafast lasers probe phenomena in bulk and microstructure semiconductors: proceedings : Bay-Point, FL, 25.03.87-26.03.87 /
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Lasers in microlithography: proceedings : Santa-Clara, CA, 02.03.87-03.03.87.
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Modern optical characterization techniques for semiconductors and semiconductor devices: proceedings : Bay-Point, FL, 26.03.87-27.03.87.
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International conference on raman and luminescence spectroscopy in technology: proceedings : Annual international technical symposium on optical and optoelectronic applied science and engineering. 0031 : San-Diego, CA, 17.08.87-19.08.87.
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Advanced processing and characterization of semiconductors. 3 : Los-Angeles, CA, 22.01.1986-24.01.1986 /
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Spectroscopic characterization techniques for semiconductor technology. 2 : Los-Angeles, CA, 21.01.1985-22.01.1985 /
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Advanced semiconductor processing and characterization of electronic and optical materials : Los-Angeles, CA, 24.01.1984-25.01.1984 /
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