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1
Book
Transmission electron microscopy : a textbook for materials science . 1 . Basics /
Williams, David B.
2009
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...
transmission
electron
microscopy
...
”
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2
Book
Transmission electron microscopy : a textbook for materials science . 2 . Diffraction /
Williams, David B.
2009
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...
transmission
electron
microscopy
...
”
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3
Book
Transmission electron microscopy : a textbook for materials science . 3 . Imaging /
Williams, David B.
2009
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transmission
electron
microscopy
...
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4
Book
Transmission electron microscopy : a textbook for materials science . 4 . Spectrometry /
Williams, David B.
2009
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transmission
electron
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...
”
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5
Book
Advances in imaging and electron physics. 113 /
Hawkes, Peter W.
2000
Subject (ZB):
“
...scanning
transmission
electron
microscopy
...
”
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6
Book
Energy filtering transmission electron microscopy.
Reimer, L.
1995
Subject (ZB):
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...
transmission
electron
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...
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7
Book
Advances in imaging and electron physics. 93 /
Hawkes, Peter W.
1995
Subject (ZB):
“
...STEM [scanning
transmission
electron
microscopy
)...
”
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8
Book
Determining nanoscale physical properties of materials by microscopy and spectroscopy: symposium : Boston, MA, 29.11.93-03.12.93.
Sarikaya, M.
1994
Subject (ZB):
“
...
transmission
electron
microscopy
...
”
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Available as
Print Edition
8
Material Type
Book
8
Type of Literature
Handbook, Textbook
4
Conference Publication
1
Year of Publication
From:
To:
Location
IEK-14
4
ZB
4
Name
Carter, C. Barry
4
Williams, David B.
4
Hawkes, Peter W.
2
Deininger, C.
1
Reimer, L.
1
Sarikaya, M.
1
Subject
imaging technique
transmission electron microscopy
6
diffraction
4
scattering
3
spectrometer
3
electron source
2
more ...
Fourier transform
1
III - V semiconductor
1
STEM [scanning transmission electron microscopy)
1
atomic spectroscopy
1
atomic structure
1
cermet
1
dynamic properties
1
elastic scattering
1
electron diffraction
1
electron energy loss spectroscopy
1
electron optics
1
electron scattering
1
electron spectroscopy
1
energy
1
epitaxy
1
fluorescence
1
high resolution
1
holography
1
image analysis
1
inelastic scattering
1
lens
1
magnetic resonance
1
materials
1
microscopy
1
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Classification
FHG - Electron microscopy
4
FHE - Imaging methods in materials characterization
2
FAN - Solid state physics - mathematical methods, computer applications
1
FAP - Advanced materials - development and applications
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
Language
English
2
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