Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Electronic Edition
Reset Filters
Show filters (1)
Electronic Edition
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Characterization, integration and reliability of HfO2 and LaLuO3 high-k/metal gate stacks for CMOS applications [E-Book] /
Nichau
,
Alexander
2013
Other Personal Name(s):
“
...
Nichau
,
Alexander
...
”
Full text
JuSER
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
Material Type
Book
1
Type of Literature
Theses
1
Year of Publication
From:
To:
Location
ZB
1
Name
Nichau, Alexander
1
Subject
MOS device
1
oxide
1
Classification
FGN - Nanotechnology
1
Language
English
1
×
Loading...