141
Vacuum and surface analysis. vol 0001 : Chinese Japanese Joint Seminar on Vacuum and Surface Analysis: proceedings : VASA : 1985: proceedings : Shanghai, 26.10.85-28.10.85.
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Hua, Z.
1988
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142
Arbeitstagung angewandte Oberflächenanalytik. 5 : Kurzfassung der Beiträge Jülich, 21.06.88-24.06.88.
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1988
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143
Vacuum and surface analysis. vol 0002 : Sino - us joint seminar on vacuum and surface analysis: proceedings : Vasa. 1987: proceedings. 1 : Beijing, 08.09.87-10.09.87.
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Hua, Z. Y.
1988
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144
Surface and interface characterization by electron optical methods : NATO advanced study institute on the study of surfaces and interfaces by electron optical techniques: proceedings : Erice, 04.04.87-15.04.87 /
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Howie, A.
1988
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145
Surface characterization and testing : San-Diego, CA, 21.08.86-22.08.86 /
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Creath, K.
1987
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146
Impedance spectroscopy : emphasizing solid materials and systems /
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147
Modern techniques of surface science.
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148
Ecasia. 1985 : Veldhoven, 14.10.1985-18.10.1985.
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1986
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149
Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
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150
Fundamentals of surface and thin film analysis /
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Chemistry and physics of solid surfaces. vol 0006 : Surface science: international summer institute. 0007: review articles : Milwaukee, WI, 07.85.
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152
Möglichkeiten und Grenzen von Oberflächenanalyseverfahren [E-Book] /
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153
Solid state physics : surfaces.
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Infrared spectroscopy of adsorbed species on the surface of transition metal oxides /
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Surface analysis of high temperature materials : chemistry and topography /
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Kemeny, G.
1984
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Chemistry and physics of solid surfaces vol 0005 : International summer institute in surface science 0006 : ISISS 0006 : Milwaukee, WI, 08.83.
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Arbeitstagung angewandte Oberflächenanalytik. 3 : Kurzfassung der Vorträge : Jülich, 08.05.1984-11.05.1984.
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1984
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Oberflächenanalyse als Dienstleistung: Einsatzbereiche und Durchführung Anbieterkatalog.
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Characterization of heterogeneous catalysts.
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Thin film and depth profile analysis.
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