1
Backscattering spectrometry /
Book
2
Handbook of modern ion beam materials analysis /
Book
3
Ion beam handbook for material analysis /
Book
4
Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /
Book
5
Materials analysis by ion channeling : submicron crystallography /
Book