ZB 119 IKP 6 ZEA-2 4 IBN-1-2 3 IFF 2

Cullis, A. G. 6 Ashok, Sekhar 2 Bourgoin, J. 2 Drabold, David A. 2 Ebert, Philipp 2 Graff, Klaus. 2 more ... Lannoo, M. 2 Mizera, E. 2 Narayan, J. 2 Richter, Harald 2 Stavola, M. 2 Stavola, Michael 2 Stoneham, A. M. 2 Vavilov, V. S. 2 Weidlich, Phillip H. 2 Wolter, Mike Jean 2 Abdullaev, Gasan Mamed Bagir ogly 1 Aerts, E. 1 Albany, J. H. 1 Allen, Charles Edmund 1 Amelinckx, Severin 1 Aseev, Aleksandre Leonidovic 1 Ast, Dieter G. 1 Bachmann, Klaus J. 1 Bartsch, Heinz 1 Baruch, P. 1 Bañobre, Asahel 1 Beke, Dezsö L. 1 Benedek, G. 1 Bube, R. H. 1 see all ... less ...

semiconductor 43 crystal defect 19 defect 14 silicon 11 III - V semiconductor 10 defect analysis 7 more ... impurity 7 gallium arsenide 6 ion implantation 5 point defect 5 scanning tunneling microscopy 5 dislocation 4 gallium 4 gettering 4 hydrogen 4 nitride 4 semiconductor device 4 semiconductor heterostructure 4 amorphous semiconductor 3 amorphous silicon 3 diffusion 3 electron microscopy 3 germanium 3 image processing 3 physical radiation effect 3 semiconductor interface 3 semiconductor processing 3 transmission electron microscopy 3 II - VI semiconductor 2 Monte Carlo method 2 see all ... less ...

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