Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
IBN-1-2
English
FGGJ - Ion beam analysis, ion beam solid interaction
Reset Filters
Show filters (3)
IBN-1-2
English
FGGJ - Ion beam analysis, ion beam solid interaction
Ask a Librarian
Books & more
: Hits
1 - 2
of
2
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Backscattering spectrometry /
Chu, Wei-Kan
1978
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Benninghoven, Alfred
1987
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Print Edition
2
Material Type
Book
2
Year of Publication
From:
To:
Location
IBN-1-2
ZB
2
IEK-14
1
IEK-4
1
Name
Benninghoven, Alfred
1
Chu, Wei-Kan
1
Mayer, James W.
1
Nicolet, Marc-A.
1
Rüdenauer, Friedrich G.
1
Werner, H. W.
1
Subject
SIMS (secondary ion mass spectroscopy)
1
Classification
FGGJ - Ion beam analysis, ion beam solid interaction
Language
English
×
Loading...
