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FFPE - Thin film electronic properties, semiconductor interfaces
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FHJ - Scanning electron microscopy, analytical electron microscopy
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FFPE - Thin film electronic properties, semiconductor interfaces
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FHJ - Scanning electron microscopy, analytical electron microscopy
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Investigation of nanoscale potential fluctuations and defects in 2D semiconducting structures by Scanning Tunneling Microscopy [E-Book] /
Landrock, Sebastian
2009
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Electronic Edition
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ZB
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Landrock, Sebastian
1
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defect
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fluctuation
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nanoelectronics
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potential
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scanning tunneling microscopy
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semiconductor
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FFPE - Thin film electronic properties, semiconductor interfaces
FHJ - Scanning electron microscopy, analytical electron microscopy
FJHE - Defects and radiation effects in semiconductors
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English
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