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FHEG - Tunneling microscopy, force microscopy
English
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FHEG - Tunneling microscopy, force microscopy
English
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1
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Creating and characterizing a single molecule device for quantitative surface science [E-Book] /
Green, Matthew Felix Blishen
2018
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Electrical Atomic Force Microscopy for Nanoelectronics [E-Book] /
Celano, Umberto
2019
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3
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Electromechanical force microscopy and tip-enhanced raman spectroscopy for polar oxide nanoparticles [E-Book] /
Röhrig, Serge
2009
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Quantitative scanning tunneling spectroscopy of non-polar III-V compound semiconductor surfaces [E-Book] /
Schnedler, Michael
2015
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Scanning Probe Microscopy [E-Book] : The Lab on a Tip /
Meyer, Ernst
2021
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6
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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STM beyond vacuum tunneling : scanning tunneling hydrogen microscopy as a route to ultra-high resolution [E-Book] /
Weiss, Christian
2012
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STM studies of islands on Cu and Pt surfaces [E-Book] /
Ikonomov, Julian Borislavov
2004
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Submolecular imaging with single particle atomic force sensors [E-Book] /
Kichin, Georgy
2014
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Surface morphology of clean and adsorbate covered Au(111) investigated by scanning tunneling microscopy under ambient conditions [E-Book] /
Huang, Lin
1996
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Available as
Electronic Edition
Material Type
Book
10
Type of Literature
Theses
8
Year of Publication
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Location
ZB
10
Name
Bennewitz, Roland
1
Celano, Umberto
1
Green, Matthew Felix Blishen
1
Huang, Lin
1
Hug, Hans J.
1
Ikonomov, Julian Borislavov
1
more ...
Kichin, Georgy
1
Lüpke, Felix
1
Meyer, Ernst
1
Röhrig, Serge
1
Schnedler, Michael
1
Weiss, Christian
1
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Subject
scanning tunneling microscopy
7
force microscopy
3
scanning probe microscopy
2
surface
2
Condensed matter.
1
Electronics.
1
more ...
Materials science.
1
Materials-Surfaces.
1
Measurement.
1
Microscopy.
1
Nanotechnology.
1
Optical materials.
1
Physical measurements.
1
Raman spectroscopy
1
Spectroscopy.
1
Surfaces (Physics).
1
Thin films.
1
barium
1
charge
1
defect analysis
1
equilibrium
1
gold
1
imaging technique
1
insulator
1
materials characterization
1
microscopy
1
modeling
1
monomolecular film
1
morphology
1
nanoelectronics
1
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Classification
FHEG - Tunneling microscopy, force microscopy
CLJE - Catalyst characterization and surface phenomena
1
CLP - Colloid chemistry, surface chemistry
1
CUSE - Raman spectroscopy
1
FFA - Surface science, surface physics - general aspects
1
FFJ - Surface structure, gas solid interface
1
more ...
FFJE - Molecular surface processes, gas surface interaction, adsorption
1
FHA - Materials characterization - general aspects
1
FHAB - Surface and thin film characterization
1
FHE - Imaging methods in materials characterization
1
FJH - Semiconductor physics
1
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Language
English
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