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FHEG - Tunneling microscopy, force microscopy
thin film
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Electronic Edition
FHEG - Tunneling microscopy, force microscopy
thin film
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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Untersuchungen an dünnen Schichten mit Photoelektronenbeugung und Rastertunnelmikroskopie [E-Book] /
Scheuch, Volker
1996
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ZB
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Lüpke, Felix
1
Scheuch, Volker
1
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scanning tunneling microscopy
2
thin film
defect analysis
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insulator
1
photoelectron spectroscopy
1
sheet
1
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FHEG - Tunneling microscopy, force microscopy
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English
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German
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