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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /
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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /

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Investigation of nanoscale potential fluctuations and defects in 2D semiconducting structures by Scanning Tunneling Microscopy [E-Book] /

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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /

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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
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Surface states and Fermi-level pinning on non-polar binary and ternary (Al,Ga)N surfaces [E-Book] /

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Surface states and Fermi-level pinning on non-polar binary and ternary (Al,Ga)N surfaces /
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