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FHEG - Tunneling microscopy, force microscopy

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scanning tunneling microscopy

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Theses

FHEG - Tunneling microscopy, force microscopy

Print Edition

scanning tunneling microscopy

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Book

Aufbau und Anwendungen eines Tieftemperaturrastertunnelmikroskops mit Spektroskopieeinheit /

Aldinger, Rolf
2000

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Creating and characterizing a single molecule device for quantitative surface science /

Green, Matthew Felix Blishen
2018

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Ladungstransport durch Graphenschichten und GaAs-Nanodrähte untersucht mit einem Multispitzen-Rastertunnelmikroskop /

Korte, Stefan
2014

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Ladungstransportmessungen an Si(111) Oberflächen mit einem Multispitzen-Rastertunnelmikroskop /

Blab, Marcus
2014

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Quantitative scanning tunneling spectroscopy of non-polar III-V compound semiconductor surfaces /

Schnedler, Michael
2015

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Rastermikroskopie mit Mikrospitzen: Untersuchungen mit dem Kraft- und Tunnel- Rastermikroskop.

Nonnenmacher, M.
1990

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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /

Schwartzkopff, Michael.
1999

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Rastertunnelmikroskopie an Supraleitern und Fulleren bei tiefen Temperaturen [Microfiche] /

Behler, Stefan.
1994

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Scanning tunneling microscope study of carbon nanotubes /

Zha, Fangxing.
2001

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Scanning tunneling potentiometry at nanoscale defects in thin films /

Lüpke, Felix
2018

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STM beyond vacuum tunneling : scanning tunneling hydrogen microscopy as a route to ultra-high resolution /

Weiss, Christian
2012

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Submolecular imaging with single particle atomic force sensors /

Kichin, Georgy
2014

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Untersuchungen über Wachstum, Haftung, Härte und Elastizität dünner Goldschichten auf unterschiedlichen Substraten mit Rasterkraftmikroskop /

Kracke, Berthold.
1996

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Untersuchungen von einzelnen löslichen Makromolekülen mit dem Rastertunnelmikroskop /

Bayerbach, Markus.
1996

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Untersuchungen zum elektrochemischen Ätzverhalten von Siliziumoberflächen /

Houbertz, Ruth.
1993

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Untersuchungen zum Stossionisationsdurchbruch in p-Germanium mit einem Tieftemperatur-Rastertunnelmikroskop /

Muz, Christof.
1998

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Untersuchungen zum Verhalten nanokristalliner Metallpartikel auf Si mit dem Rastertunnelmikroskop /

Radojkovic, Peter.
1999

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Print Edition

Book 17

Theses

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To:

ZB 17

Aldinger, Rolf 1 Bayerbach, Markus. 1 Behler, Stefan. 1 Blab, Marcus 1 Green, Matthew Felix Blishen 1 Houbertz, Ruth. 1 more ... Kichin, Georgy 1 Korte, Stefan 1 Kracke, Berthold. 1 Lüpke, Felix 1 Muz, Christof. 1 Nonnenmacher, M. 1 Radojkovic, Peter. 1 Schnedler, Michael 1 Schwartzkopff, Michael. 1 Weiss, Christian 1 Zha, Fangxing. 1 see all ... less ...

scanning tunneling microscopy force microscopy 3 charge transport 2 low temperature 2 thin film 2 III - V semiconductor 1 more ... carbon 1 charge 1 defect analysis 1 deuterium 1 fullerenes 1 germanium 1 graphene 1 high resolution 1 hydrogen 1 imaging technique 1 insulator 1 luminescence 1 macromolecule 1 materials characterization 1 mechanical properties 1 microscopy 1 modeling 1 monomolecular film 1 nanostructured material 1 organic matter 1 preparation 1 quantum dot 1 semiconductor 1 semiconductor surface 1 see all ... less ...

FHEG - Tunneling microscopy, force microscopy FHAB - Surface and thin film characterization 4 FHA - Materials characterization - general aspects 3 FHE - Imaging methods in materials characterization 3 FNX - Carbon, carbon materials 3 FFJ - Surface structure, gas solid interface 2 more ... CLJE - Catalyst characterization and surface phenomena 1 CLP - Colloid chemistry, surface chemistry 1 CNRO - Electrode processes 1 FFA - Surface science, surface physics - general aspects 1 FFJE - Molecular surface processes, gas surface interaction, adsorption 1 FFM - Liquid interfaces, adhesion 1 FGCB - Nucleation, crystallization phenomena 1 FGK - Thin film technology, epitaxy 1 FJH - Semiconductor physics 1 FJKB - Elemental semiconductors 1 FJKC - III - V semiconductors 1 FLE - Superconductor materials 1 see all ... less ...

English 5 German 3

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