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FHEG - Tunneling microscopy, force microscopy
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surface analysis
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FHEG - Tunneling microscopy, force microscopy
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surface analysis
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Electromechanical force microscopy and tip-enhanced raman spectroscopy for polar oxide nanoparticles /
Röhrig, Serge
2009
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Untersuchungen zum elektrochemischen Ätzverhalten von Siliziumoberflächen /
Houbertz, Ruth.
1993
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Houbertz, Ruth.
1
Röhrig, Serge
1
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surface analysis
Raman spectroscopy
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barium
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force microscopy
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nanoparticle
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scanning tunneling microscopy
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silicon
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titanate
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Classification
FHEG - Tunneling microscopy, force microscopy
CNRO - Electrode processes
1
CUSE - Raman spectroscopy
1
FHAB - Surface and thin film characterization
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English
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