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1

Journal Article

Point defects, dopant atoms, and compensation effects in CdSe and CdS cleavage surfaces

Siemens, B.
1999

Thin solid films, 343-344 (1999) S. 537 - 540

“...Erforschung neuer Materialien...”

2

Journal Article

Imaging individual dopant atoms on cleavage surfaces of wirtzite-structure compound semiconductors

Siemens, B.
1999

Physical review / B, 59 (1999) S. 2995 - 2999

“...Erforschung neuer Materialien...”
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