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Ihle, S.
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Strüder, L.
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Verbeeck, J.
Contribution to a conference proceedings
Controlling Configuration-Based Phenomena
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Ihle, S.
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Strüder, L.
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Verbeeck, J.
Contribution to a conference proceedings
Controlling Configuration-Based Phenomena
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Contribution to a conference proceedings
Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
Müller - Caspary, K.
2016
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Research Program
Controlling Configuration-Based Phenomena
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Mikrostrukturforschung; PGI-5
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Physik Nanoskaliger Systeme; ER-C-1
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2016
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