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Lüth, H.
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von der Hart, A.
Institut für Halbleiterschichten und Bauelemente; ISG-1
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2005
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Lüth, H.
AND
von der Hart, A.
Institut für Halbleiterschichten und Bauelemente; ISG-1
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2005
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Journal Article
Measurement of overlay accuracy of E-Beam generated patterns for the fabrication of vertical gate all-around transostores
Moers, J.
2005
Verhandlungen der Deutschen Physikalischen Gesellschaft, 40 (2005) S. 279
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Conference Presentation
Overlay of E-Beam generated patterns for the application in vertical gate all-arround MOSFET devices
Moers, J.
2005
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Journal Article
Size-dependent Photoconductivity in MBE-Grown GaN-Nanowires
Calarco, R.
2005
Nano letters, 5 (2005) S. 981 - 984
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Center of Nanoelectronic Systems for Information Technology; CNI
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