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Strüder, Lothar
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Verbeeck, Johan
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Winkler, Florian
Publications database
Controlling Configuration-Based Phenomena
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Strüder, Lothar
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Verbeeck, Johan
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Winkler, Florian
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Controlling Configuration-Based Phenomena
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Journal Article
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Müller-Caspary, Knut
2016
Microscopy and microanalysis, 22 (2016) S3, S. 484 - 485
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Research Program
Controlling Configuration-Based Phenomena
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Physik Nanoskaliger Systeme; ER-C-1
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