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Tillmann, R. G. E.
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Urban, K.
Mikrostrukturforschung; IFF-IMF
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Tillmann, R. G. E.
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Urban, K.
Mikrostrukturforschung; IFF-IMF
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Conference Presentation
Spherical-aberration correction and exit-plane wave function reconstruction: Synergetic tools for the atomic-scale imaging of structural imperfections semiconductor materials
Tillmann, R. G. E.
2005
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Journal Article
Atomic structure of beta-tantalum nanocrystallites
Tillmann, R. G. E.
2005
Microscopy and microanalysis, 11 (2005) S. 534 - 544
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Improvements in reconnoitring the structure of lattice defects in metals and semiconductors at atomic resolution: Vantages accruing from the combined use of spherical-abberation co...
Tillmann, R. G. E.
2005
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Thust, A.
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Tillmann, R. G. E.
Urban, K.
Gerber, Andreas
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Kondensierte Materie
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2005
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