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Elektrokeramische Materialien; IFF-EKM
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Institut für Halbleiterschichten und Bauelemente; ISG-1
Poppe, U.
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Buchal, Ch.
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Elektrokeramische Materialien; IFF-EKM
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Institut für Halbleiterschichten und Bauelemente; ISG-1
Poppe, U.
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Buchal, Ch.
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Journal Article
Surface treatment effects on the thickness dependence of the remanent polarization of PbZr0.52Ti0.48O3 capacitors
Rodriguez Contreras, J.
2003
Applied physics letters, 83 (2003) S. 126
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Conference Presentation
Structural and ferroelectric properties of epitaxial PbZr0.52Ti0.48O3 thin films prepared on SrRuO3/SrTiO3(100) substrates
Rodriguez Contreras, J.
2002
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Buchal, Ch.
Kohlstedt, H.
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Poppe, U.
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Waser, R.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Institut für Halbleiterschichten und Bauelemente; ISG-1
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