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Elektronische Materialien; IFF-6
Gürlich, C.
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Peralagu, U.
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Elektronische Materialien; IFF-6
Gürlich, C.
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Peralagu, U.
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Journal Article
Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
Weides, M.
2010
Superconductor science and technology, 23 (2010) S. 095007
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Goldobin, E.
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Gürlich, C.
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Grundlagen für zukünftige Informationstechnologien
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Elektronische Materialien; IFF-6
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