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Elektronische Materialien; IFF-IEM AND Mikrostrukturforschung; IFF-IMF

2004

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Elektronische Materialien; IFF-IEM AND Mikrostrukturforschung; IFF-IMF

2004

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Conference Presentation 5 Journal Article 3

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Journal Article

High temperature superconductor dc-SQUID microscope with a soft magnetic flux guide

Poppe, U.
2004

Superconductor science and technology, 17 (2004) S. s191 - s195

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2

Conference Presentation

Nucleation and growth of thin (Ba,Sr)TiO films during MOCVD on Pt and Si surfaces

Regnery, S.
2004

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3

Conference Presentation

Sharp ferroelectric phase transition in strained single-crystalline SRO/BST/SRO capacitors

Dittmann, R.
2004

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4

Conference Presentation

Properties of SrZrO3 nanowires deposited on rippled SrRuO3 thin films

Vasco, E.
2004

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5

Conference Presentation

MOCVD of SrTa2O6 thin films for high-k applications

Regnery, S.
2004

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6

Conference Presentation

Resistive Memory Devices based on Metal-Ferroelectric-Metal Junctions

Kohlstedt, H.
2004

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7

Journal Article

Microstructure and interfaces of HfO2 thin films grown on silicon substrates

He, J. Q.
2004

Journal of crystal growth, 262 (2004) S. 295 - 303

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Journal Article

(Ba,Sr)TiO3 thin film growth in a batch processing MOCVD reactor

Regnery, S.
2003

Journal of the European Ceramic Society, 24 (2003) S. 271-276

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Conference Presentation 5 Journal Article 3

Waser, R. 7 Jia, C. L. 6 Ding, Y. 3 Ehrhart, P. 3 He, J. Q. 3 Regnery, S. 3 more ... Szot, K. 3 Dittmann, R. 2 He, J. 2 Poppe, U. 2 Schumacher, M. 2 Urban, K. 2 Vasco, E. 2 Breunig, I. 1 Buchal, C. 1 Erhart, P. 1 Faley, Michael 1 Fitsilis, F. 1 Glaas, Walter 1 Halling, H. 1 Haselier, H. 1 Hoffmann-Eifert, S. 1 Jungbluth, B. 1 Karthäuser, Silvia 1 Kohlstedt, H. 1 Lehnen, P. 1 Miedl, St. 1 Pertsev, N. A. 1 Pertsev, R. A. 1 Plonka, R. 1 see all ... less ...

Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik 7 Kondensierte Materie 2

Center of Nanoelectronic Systems for Information Technology; CNI 8 Elektronische Materialien; IFF-IEM Mikrostrukturforschung; IFF-IMF Institut für Halbleiterschichten und Bauelemente; ISG-1 1 Zentralinstitut für Elektronik; ZEL 1 Zentralinstitut für Technologie; ZAT 1

2004

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