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1

Inelastic electron tunneling spectroscopy for probing strongly correlated many-body systems by scanning tunneling microscopy

Eickhoff, Fabian
2020

Physical Review B Physical review / B, 101 101 (2020 2020) 12 12, S. 125405 125405

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2

Journal Article

Parasitic conduction channels in topological insulator thin films

Just, Sven
2020

Physical Review B Physical review / B, 101 101 (2020 2020) 24 24, S. 245413 245413

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3

Journal Article

The theory of scanning quantum dot microscopy

Wagner, Christian
2019

Journal of physics / Condensed matter Condensed matter, 31 (2019) S. 475901

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4

Journal Article

In-situ study of two-dimensional dendritic growth of hexagonal boron nitride

Felter, Janina
2019

2D Materials, 6 (2019) 4, S. 045005

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5

Journal Article

Identifying surface reaction intermediates with photoemission tomography

Yang, Xiaosheng
2019

Nature Communications, 10 (2019) 1, S. 3189

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6

Journal Article

Can photoemission tomography be useful for small, strongly-interacting adsorbate systems?

Egger, Larissa
2019

New journal of physics, 21 (2019) 4, S. 043003 -

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7

Journal Article

Quantitative imaging of electric surface potentials with single-atom sensitivity

Wagner, Christian
2019

Nature materials, 18 (2019) S. 853–859

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8

Journal Article

In-situ four-tip STM investigation of the transition from 2D to 3D charge transport in SrTiO3

Leis, Arthur
2019

Scientific reports, 9 (2019) 1, S. 2476

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9

Journal Article

Surface structures of tellurium on Si(111)–(7×7) studied by low-energy electron diffraction and scanning tunneling microscopy

Lüpke, Felix
2019

Surface science, 681 (2019) S. 130 - 133

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10

Journal Article

Torricelli: A software to determine atomic spatial distributions from normal incidence x-ray standing wave data

Bocquet, F. C.
2019

Computer physics communications, 235 (2019) S. 502 - 513

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11

Journal Article

Charge transport in GaAs nanowires: interplay between conductivity through the interior and surface conductivity

Korte, Stefan
2019

Journal of physics / Condensed matter Condensed matter, 31 (2019) 7, S. 074004 -

12

Journal Article

Erratum: “Low vibration laboratory with a single-stage vibration isolation for microscopy applications” [Rev. Sci. Instrum. 88, 023703 (2017)]

Voigtländer, Bert
2018

Review of scientific instruments, 89 (2018) 1, S. 019901-1 - 019901-9

Published on 2018-01-03. Available in OpenAccess from 2019-01-03. Published on 2018-01-03. Available in OpenAccess from 2019-01-03.

13

Journal Article

Four-point probe measurements using current probes with voltage feedback to measure electric potentials

Lüpke, Felix
2018

Journal of physics / Condensed matter, 30 (2018) 5, S. 054004-1 - 054004-7

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14

Journal Article

Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis

Voigtländer, Bert
2018

Review of scientific instruments, 89 (2018) 10, S. 101101-1 - 101101-23

Published on 2018-10-15. Available in OpenAccess from 2019-10-15. Published on 2018-10-15. Available in OpenAccess from 2019-10-15.

15

Journal Article

Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope

Nägelein, Andreas
2018

Nano research, 11 (2018) 11, S. 5924-5934

16

Journal Article

Long Vertical Distance Bonding of the Hexagonal Boron Nitride Monolayer on the Cu(111) Surface

Brülke, Christine
2017

The journal of physical chemistry / C C, Nanomaterials and interfaces, 121 (2017) 43, S. 23964 - 23973

17

Journal Article

Low vibration laboratory with a single-stage vibration isolation for microscopy applications

Voigtländer, Bert
2017

Review of scientific instruments, 88 (2017) 2, S. 023703 -1 - 023703-7

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18

Journal Article

Surface conductivity of Si(100) and Ge(100) surfaces determined from four-point transport measurements using an analytical N -layer conductance model

Just, Sven
2017

Physical Review B Physical review / B, 95 95 (2017 2017) 7 7, S. 075310 075310

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19

Journal Article

Charge Transfer and Orbital Level Alignment at Inorganic/Organic Interfaces: The Role of Dielectric Interlayers

Hollerer, Michael
2017

ACS nano, 11 (2017) 6, S. 6252 - 6260

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20

Journal Article

Chalcogenide-based van der Waals epitaxy: Interface conductivity of tellurium on Si(111)

Lüpke, Felix
2017

Physical Review B Physical review / B, 96 96 (2017 2017) 3 3, S. 035301 035301

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