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1
Contribution to a book
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Measurement of the Germanium fraction in strained and relaxed SiGe by Spectroscopic Ellipsometry
Moers, J.
2006
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,
M
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2
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Vertical p-channel Double-Gate MOSFETs
Moers, J.
2003
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Goryll
,
M
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3
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Double gate MOSFET with vertical channel
Moers, J.
2003
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,
M
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4
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Thin low-temperature gate oxides for vertical field-effect transistors
Goryll
,
M
.
2002
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,
M
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5
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Carbon-induced Ge islands on Si(001) grown by LPCVD
Goryll
,
M
.
2000
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,
M
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6
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Morphological transition of Ge islands on Si(001) grown by LPCVD
Goryll
,
M
.
2000
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,
M
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7
Contribution to a book
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Morphological transition of Ge islands on Si(001) grown by LPCVD
Goryll
,
M
.
1999
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Goryll
,
M
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7
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Goryll, M.
7
Lüth, H.
6
Moers, J.
4
Vescan, L.
4
Kordos, P.
3
Mantl, S.
3
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Trellenkamp, Stefan
3
Marso, M.
2
von der Hart, A.
2
Buca, Dan Mihai
1
Caymax, M.
1
Hogg, S.
1
Kluth, P.
1
Loo, R.
1
Zhao, Q.-T.
1
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Research Program
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
3
Halbleiterschichtsysteme und Mesoskopische Strukturen
2
Grundlagen für zukünftige Informationstechnologien
1
ohne FE
1
Contributing Institute
Institut für Halbleiterschichten und Bauelemente; ISG-1
4
Institut für Schicht- und Ionentechnik; ISI
3
Center of Nanoelectronic Systems for Information Technology; CNI
1
JARA-FIT; JARA-FIT
1
Scientific Report
2000
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2003
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1999
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