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1
Journal Article
Determination of the doping concentration profile in Si delta-doped GaAs layers using micro-Raman spectroscopy of bevelled structures
Srnanek, R.
2006
Thin solid films, 506-507 (2006)
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Irmer
,
G
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2
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Precipitation in low temperature grown GaAs
Herms, M.
2002
Materials science and engineering / B, 91-92 (2002) S. 466 - 469
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Irmer
,
G
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3
Journal Article
Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
Irmer
,
G
.
2000
Journal of applied physics, 88 (2000) 4, S. 1873 - 1879
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G
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Irmer, G.
3
Goerigk, G.
2
Herms, M.
2
Bedel, E.
1
Claverie, A.
1
Donoval, D.
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Florovic, M.
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Geurts, J.
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Kordos, P.
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Kovac, J.
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Lentze, M.
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Mc Phail, D. S.
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Monecke, J.
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Radziewicz, D.
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Research Program
Grundlagen für zukünftige Informationstechnologien
1
Kondensierte Materie
1
Methodenentwicklung für Synchrotron- und Neutronenstrahlung
1
ohne Topic
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Institut für Festkörperforschung; IFF
1
Institut für Halbleiterschichten und Bauelemente; ISG-1
1
Streumethoden; IFF-4
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