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Kondensierte Materie
Mikrostrukturforschung; IFF-IMF
Tillmann, R. G. E.
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Kondensierte Materie
Mikrostrukturforschung; IFF-IMF
Tillmann, R. G. E.
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Journal Article
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Conference Presentation
Quantitative TEM analysis of structural defects in helium implanted silicon
Hueging, N.
2003
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Journal Article
Impact of beryllium dopants on the stability of LT-grown AlAs/GaAs:Be heterostructures against thermally activated intermixing
Tillmann, R. G. E.
2003
Thin solid films, 437 (2003) S. 74 - 82
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Quantitative Evaluation of Focal Series in HRTEM
Thust, A.
2003
Microscopy and microanalysis, 9 (2003) S. 62 - 63
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Journal Article
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Conference Presentation
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Tillmann, R. G. E.
Luysberg, Martina
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Urban, K.
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Hueging, N.
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Jia, C.
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Lentzen, M.
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Thust, A.
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Research Program
Kondensierte Materie
Contributing Institute
Mikrostrukturforschung; IFF-IMF
Scientific Report
2003
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