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1999

Ionentechnik

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1999

Ionentechnik

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Talk (non-conference) 26 Journal Article 23 Poster 14 Contribution to a book 7 Contribution to a conference proceedings 7 Conference Presentation 3

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61

BaTiO3 waveguides on MgO buffered-sapphire single crystals

Lisoni, J. G.
1999

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62

Strukturelle, elektrische und optische Charakterisierung halbleitender Ru2Si3-Schichten

Lenssen, D.
1999

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63

Structural electrical and optical characterization of semiconductor Ru2Si3

Lenssen, D.
1999

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64

Contribution to a book
Contribution to a conference proceedings

Ultrafast silicon based internal photoemission detectors

Löken, M.
1999

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65

Talk (non-conference)

Optische Eigenschaften ferroelektrischer Kristalle

Buchal, C.
1999

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66

Talk (non-conference)

Optische Eigenschaften ferroelektrischer Kristalle

Buchal, C.
1999

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67

Talk (non-conference)

The Jülich SQUID Company

Buchal, C.
1999

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68

Journal Article

Ion implantation of optical ferroelectrics

Buchal, C.
1999

Journal of electroceramics, 3 (1999) S. 179

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69

Contribution to a book
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Ionenimplantation für photorefractive Kristalle und optische Emitter

Buchal, C.
1999

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70

Talk (non-conference)

Internal photoemission detectors

Buchal, C.
1999

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71

Talk (non-conference)

Ferroelectric oxides for optoelectronic applications

Buchal, C.
1999

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72

Elektrooptik und Nichtlineare Optik ferroelektrischer Kristalle

Buchal, C.
1999

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73

Talk (non-conference)

Dünnschichtwachstum der Ferroelektrika

Buchal, C.
1999

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Publications database 73 Open Access 2

Talk (non-conference) 26 Journal Article 23 Poster 14 Contribution to a book 7 Contribution to a conference proceedings 7 Conference Presentation 3

Buchal, C. 34 Mantl, S. 29 Kappius, L. 16 Mesters, S. 12 Schubert, Jürgen 11 Zhao, Q. T. 11 more ... Zander, W. 10 Holländer, Bernhard 9 Bay, H. L. 7 Siegert, M. 7 Eckau, A. 5 Kabius, B. 5 Löken, M. 5 Becker, J. S. 3 Breuer, U. 3 Carius, R. 3 Dolle, M. 3 Fluck, S. O. 3 Günter, P. 3 Herzog, H. J. 3 Kahlmann, F. 3 Kibbel, H. 3 Klinkhammer, F. 3 Kluth, P. 3 Lisoni, J. G. 3 Tyagi, A. K. 3 Xu, J. 3 Abstreiter, G. 2 Beckers, L. 2 Brunner, P. C. 2 see all ... less ...

Ionentechnik Methodenentwicklung zur massenspektrometrischen Tiefenprofilanalyse von Oberflächen 2

Institut für Schicht- und Ionentechnik; ISI 73 Zentralabteilung für Chemische Analysen; ZCH 2

1999

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