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1

Evaluation of surface-based hippocampal registration using ground-truth subfield definitions

DeKraker, J.
2023

“...Khan, A. R....”

2

Journal Article

Study of the relaxation of strain in patterned Si/SiGe structures using an x-ray diffraction technique

Khan, A. R.
2007

Semiconductor science and technology, 22 (2007) S. s212 - s215

“...Khan, A. R....”

3

Theory of X-ray Diffraction from Partially Relaxed SiGe/Si Layers

Trinkaus, H.
2006

“...Khan, A. R....”

4

Contribution to a book
Contribution to a conference proceedings

Study of Relaxation of Strain in Patterned Structures using X-Ray Diffraction Technique

Khan, A. R.
2006

“...Khan, A. R....”

5

Study of Relaxation of Strain in Patterned Structures using X-Ray Diffraction Technique

Khan, A. R.
2006

“...Khan, A. R....”

6

Contribution to a book
Contribution to a conference proceedings

Theory of X-ray Diffraction from Partially Relaxed SiGe/Si Layers

Trinkaus, H.
2006

“...Khan, A. R....”

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