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1
Journal Article
Advanced characterization tools for thin films in low-E-systems
Weis, H.
1999
Thin solid films, 351 (1999) S. 184 - 189
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Grosse
,
P
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2
Journal Article
Porosity superlattices: a new class of Si heterostructures
Grosse
,
P
.
Journal of physics / D, 27 (1994) S. 1333 - 1336
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Grosse
,
P
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Grosse, P.
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Berger, M. G.
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Dieker, C .
1
Friedrich, I.
1
Harlitze, L.
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Müggenburg, T.
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Münder, H.
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Theiß, W.
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Thönissen, M.
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Grenzflächenaspekte der Informationstechnik
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Halbleiter-Nanoelektronik; IBN-1
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Institut für Grenzflächenforschung und Vakuumphysik; IGV
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1999
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