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1

Journal Article

Determination of the doping concentration profile in Si delta-doped GaAs layers using micro-Raman spectroscopy of bevelled structures

Srnanek, R.
2006

Thin solid films, 506-507 (2006)

“...Irmer, G....”

2

Contribution to a book
Contribution to a conference proceedings

Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle X-ray scattering

Herms, M.
2005

“...Irmer, G....”

3

Journal Article

Precipitation in low temperature grown GaAs

Herms, M.
2002

Materials science and engineering / B, 91-92 (2002) S. 466 - 469

“...Irmer, G....”

4

Journal Article

Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering

Irmer, G.
2000

Journal of applied physics, 88 (2000) 4, S. 1873 - 1879

“...Irmer, G....”
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