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Select result number 1
1
Journal Article
Electrical control of the reflectance of porous silicon layers
Thönissen
,
M
.
2000
Journal of porous materials, 7 (2000) S. 205
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Thönissen
,
M
....
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2
Journal Article
Formation of porous silicon filter structures with different properties on small areas
Arens-Fischer, R.
2000
Journal of porous materials, 7 (2000) S. 223
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...
Thönissen
,
M
....
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3
Book
Dissertation / PhD Thesis
Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen
Thönissen
,
M
.
1999
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Thönissen
,
M
....
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4
Talk (non-conference)
Lateral variation of the etchrate of porous silicon by patterning
Arens-Fischer, R.
1999
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Thönissen
,
M
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5
Report
Book
Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium
Thönissen
,
M
.
1994
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Thönissen
,
M
....
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Select result number 6
6
Journal Article
Porosity superlattices: a new class of Si heterostructures
Grosse, P.
Journal of physics / D, 27 (1994) S. 1333 - 1336
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Thönissen
,
M
....
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Dissertation / PhD Thesis
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1
Name
Thönissen, M.
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Lüth, H.
4
Arens-Fischer, R.
3
Ganse, V.
2
Hunkel, D.
2
Krüger, M.
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Marso, M.
2
Berger, M.
1
Berger, M. G.
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Dieker, C .
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Grosse, P.
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Hunkel, D. G.
1
Marso, M. A.
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Münder, H.
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Theiss, W.
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Theiß, W.
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Research Program
Halbleiterschichtsysteme und Mesoskopische Strukturen
3
ohne FE
1
ohne Topic
1
Contributing Institute
Institut für Schicht- und Ionentechnik; ISI
4
Halbleiter-Nanoelektronik; IBN-1
1
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Scientific Report
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