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Secondary ion mass spectrometry : International conference on secondary ion mass spectrometry. 0007: proceedings : SIMS. 0007 : Monterey, CA, 03.09.89-08.09.89.
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Other Personal Name(s): “...Benninghoven, A....”
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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
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Other Personal Name(s): “...Benninghoven, A....”
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Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
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Other Personal Name(s): “...Benninghoven, A....”
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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
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Other Personal Name(s): “...Benninghoven, A....”
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Ion formation from organic solids: international conference 0002: proceedings : IFOS 0002: proceedings : Münster, 07.09.1982-09.09.1982.
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Other Personal Name(s): “...Benninghoven, A....”
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Ecoss. 0004 : Münster, 14.09.81-16.09.81.
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Secondary ion mass spectrometry: international conference 0003: proceedings : SIMS 0003: proceedings : Budapest, 30.08.81-05.09.81.
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Secondary Ion Mass Spectrometry SIMS II [E-Book] : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979 /
Other Personal Name(s): “...Benninghoven, A....”

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Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.
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Quantitative Bestimmung der Sekundärionenausbeuten sauerstoffbedeckter Metalle.
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Other Personal Name(s): “...Benninghoven, A....”
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Ergebnisse der Hochvakuumtechnik und der Physik dünner Schichten. 2 /
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Becker, W.
1971
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